SIMAGIS®, developed by Smart Imaging Technologies, is an innovative and robust table-based image analysis software that delivers “Natural Automation”™ for repetitive image analysis tasks. 

In the Semiconductor Lithography and Etch applications, SIMAGIS is a powerful offline SEM Image Analysis solution for Top Down and Cross-Sections and from CD measurement to Line Edge and Line Width Roughness.

ChipInsight®, is a full-chip feature contour extraction tool. It closes the verification and validation loop using high resolution images from actual wafer prints. The software complements model based OPC and verification tools.